FMR studies of CrO2 epitaxial thin films

dc.contributor.authorRameev, BZ
dc.contributor.authorYilgin, R
dc.contributor.authorAktas, B
dc.contributor.authorGupta, A
dc.contributor.authorTagirov, LR
dc.date.accessioned2025-10-29T11:21:00Z
dc.date.issued2003
dc.departmentGebze Teknik Üniversitesi
dc.description1st International Symposium and Summer School on Nano and Giga Challenges in Microelectronics Research -- SEP 10-13, 2002 -- MOSCOW, RUSSIA
dc.description.abstractEpitaxial (100) thin films of CrO2 of various thickness were fabricated by chemical vapor deposition (CVD) at atmospheric oxygen pressure onto (100) TiO2 single-crystal substrates. Ferromagnetic resonance (FMR) measurements were performed at the X-band (9.5 GHz) at room temperature. The angular dependencies of the FMR spectra in both in-plane and out-of-plane geometries were measured. The directions of easy and hard axes of magnetization were determined from the in-plane measurements, when the DC magnetic field was rotated in the film plane. It was established that, at room temperature, the easy axis of magnetization is parallel to the c-axis of the CrO2 rutile structure. Splitting of the FMR signal into surface and bulk modes was observed due to surface pinning of magnetization at interfaces of the CrO2 films. The magnetoelastic anisotropy was observed to be enhanced with decreasing film thickness. The values of the room temperature effective magnetization and parameters of the anisotropy field were obtained from analysis of the FMR data. (C) 2003 Elsevier B.V. All rights reserved.
dc.description.sponsorshipMotorola Digital DNA Lab,Kurchatov Inst, Russian Res Ctr,Moscow State Univ,Int Sci & Technol Ctr,Elsevier,USAF, European Off Aerosp Res & Dev
dc.identifier.doi10.1016/S0167-9317(03)00318-6
dc.identifier.endpage340
dc.identifier.issn0167-9317
dc.identifier.issn1873-5568
dc.identifier.issue2-4
dc.identifier.orcid0000-0002-1549-7940
dc.identifier.orcid0000-0002-1785-7209
dc.identifier.orcid0000-0003-0828-8312
dc.identifier.scopus2-s2.0-0141457864
dc.identifier.scopusqualityQ2
dc.identifier.startpage336
dc.identifier.urihttps://doi.org/10.1016/S0167-9317(03)00318-6
dc.identifier.urihttps://hdl.handle.net/20.500.14854/8834
dc.identifier.volume69
dc.identifier.wosWOS:000185725300033
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier
dc.relation.ispartofMicroelectronic Engineering
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20251020
dc.subjectthin films
dc.subjecthalf-metallic materials
dc.subjectmagnetic anisotropy
dc.subjectferromagnetic resonance
dc.titleFMR studies of CrO2 epitaxial thin films
dc.typeConference Object

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