A new technique for measuring the microwave penetration depth in high-T-c superconducting thin films

dc.contributor.authorAktas, B
dc.contributor.authorDurusoy, HZ
dc.date.accessioned2025-10-29T11:30:39Z
dc.date.issued1996
dc.departmentGebze Teknik Üniversitesi
dc.description.abstractThe electron spin resonance (ESR) technique has been used to obtain the microwave (MW) penetration depth of YBa2Cu3O7 thin films. An ESR-signal-generating marker was placed in between two high-temperature superconducting (HTSC) films to probe the MW field penetrating through the films. Below the superconducting transition temperature (T-c) the HTSC film started to screen the marker inside the sandwich. A meaningfully diminishing ESR signal was reproducibly recorded for various samples with different markers such as paramagnetic diphenyl pierylhydrazy (DPPH), Mn++ impurity in MgO and a ferromagnetic (FM) permalloy film. The temperature dependence of the ESR signal intensity above and below T-c has been studied to deduce the penetration depth from the measured signal intensity. A very rapid change of A just below T-c, slowed down later at lower temperatures and became smoothly changing. The value lambda(ab) = 1020 Angstrom has been measured for c-axis films at 77 K.
dc.identifier.doi10.1016/0921-4534(96)00114-1
dc.identifier.endpage85
dc.identifier.issn0921-4534
dc.identifier.issue1-2
dc.identifier.scopus2-s2.0-0041627339
dc.identifier.scopusqualityQ3
dc.identifier.startpage81
dc.identifier.urihttps://doi.org/10.1016/0921-4534(96)00114-1
dc.identifier.urihttps://hdl.handle.net/20.500.14854/11650
dc.identifier.volume260
dc.identifier.wosWOS:A1996UH47800011
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherElsevier Science Bv
dc.relation.ispartofPhysica C
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20251020
dc.subjectTemperature-Dependence
dc.subjectSurface Impedance
dc.subjectAbsorption
dc.titleA new technique for measuring the microwave penetration depth in high-T-c superconducting thin films
dc.typeArticle

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