Failure Mode Extraction via Vectorization and Clustering: A Case Study on Amazon Reviews

dc.contributor.authorÜnver, Mustafa
dc.date.accessioned2025-10-29T12:08:19Z
dc.date.issued2023
dc.departmentGebze Teknik Üniversitesi
dc.description2023 IEEE International Conference on Electrical, Computer and Energy Technologies, ICECET 2023 -- Cape Town -- 196833
dc.description.abstractDue to the fact that consumers have mostly preferred e-commerce sites as a purchasing channel in recent years, it is necessary to focus on the online marketing processes for the manufacturers and get more benefit from it. Thus, product reviews on online sites provide great feedbacks for companies to improve their products or services and for potential customers on purchase decisions. However, it is not possible to evaluate every single feedback for a specific product by a company, due to the immense amount of post-sale reviews for a certain product. In that study, negative categorical customer reviews are crawled for a specific product from amazon.com, then reviews are converted into vectors using Doc2Vec and finally, reviews are clustered by using k-means, and DBSCAN algorithms. As a result of clustering and cluster labeling, the most frequent topics (failure modes) are extracted along with pointless reviews. The result of the clustering presented useful managerial insights for product improvement processes and a beneficial perspective for potential customers on purchasing decisions concerning the topic frequency and mean star values. Besides, the proposed pipeline can be used as a topic modeling approach in terms of its promising results. © 2024 Elsevier B.V., All rights reserved.
dc.identifier.doi10.1109/ICECET58911.2023.10389603
dc.identifier.isbn9798350327816
dc.identifier.scopus2-s2.0-85187248891
dc.identifier.scopusqualityN/A
dc.identifier.urihttps://doi.org/10.1109/ICECET58911.2023.10389603
dc.identifier.urihttps://hdl.handle.net/20.500.14854/14405
dc.indekslendigikaynakScopus
dc.institutionauthorÜnver, Mustafa
dc.language.isoen
dc.publisherInstitute of Electrical and Electronics Engineers Inc.
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_Scopus_20251020
dc.subjectClustering
dc.subjectDBSCAN
dc.subjectDoc2vec
dc.subjectK-Means
dc.subjectText mining
dc.subjectVectorization
dc.titleFailure Mode Extraction via Vectorization and Clustering: A Case Study on Amazon Reviews
dc.typeConference Object

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