High fluence ion beam modification of polymer surfaces: EPR and XPS studies

Abstract

Polyethylene, polyamide-6 and polyimide foils implanted with 100 keV B+, P+ and Sb+ ions to a fluence range of 10(15)-10(17) cm(-2) have been studied using the electron paramagnetic resonance (EPR) and X-ray photoelectron spectroscopy (XPS) methods. The experimental data allow the comparison of the implantation-induced changes both in a given polymer foil under different ion beam regimes and in different polymers under similar ion-bombardment conditions. The high fluence implantation of boron ions. depositing energy mainly via electronic stopping, was found to be accompanied with the effective formation of K-bonded carbon-rich clusters, By contrast, heavier (phosphorus and antimony) ions, which deposit energy predominantly in nuclear collisions. produced a lower concentration of x-radicals and a less carbonised top surface layer. The peculiarities and main trends of the alterations of the polymer structure and composition induced via electronic and nuclear stopping have also been discussed. (C) 2001 Elsevier Science B,V. All rights reserved.