Material characterization for synthesized catalysts: Morphology, microstructure, and crystallographic phase

Abstract

This chapter includes the most used microscopic techniques of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Besides, the basics of X-ray diffraction (XRD) to characterize synthesized catalysts are summarized briefly. A short introduction to morphology, crystal structure, and how the methods are applied can be found. Moreover, in order to provide an idea of how the results are obtained and interpreted, a few examples are furnished. © 2023 Elsevier B.V., All rights reserved.