Residual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques

Basit Öğe Kaydı
dc.contributor.authorAtar, E
dc.contributor.authorSarioglu, C
dc.contributor.authorDemirler, U
dc.contributor.authorKayali, ES
dc.contributor.authorCimenoglu, H
dc.date.accessioned2025-10-29T11:20:54Z
dc.date.issued2003
dc.departmentFakülteler, Temel Bilimler Fakültesi, Matematik Bölümü
dc.description.abstractThe residual stresses in ceramic thin films obtained by the indentation method have been found to be three times higher than those of the X-ray diffraction method. This discrepancy can be eliminated by setting the geometrical factor for the Vickers pyramid indenter to 1 in the relevant equation of the indentation method. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
dc.identifier.doi10.1016/S1359-6462(03)00019-8
dc.identifier.endpage1336
dc.identifier.issn1359-6462
dc.identifier.issue9
dc.identifier.orcid0000-0002-8157-5556
dc.identifier.orcid0000-0002-9921-7108
dc.identifier.scopus2-s2.0-0037408598
dc.identifier.scopusqualityQ1
dc.identifier.startpage1331
dc.identifier.urihttps://doi.org/10.1016/S1359-6462(03)00019-8
dc.identifier.urihttps://hdl.handle.net/20.500.14854/8777
dc.identifier.volume48
dc.identifier.wosWOS:000181890700019
dc.identifier.wosqualityQ1
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherPergamon-Elsevier Science Ltd
dc.relation.ispartofScripta Materialia
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20251020
dc.subjectmicroindentation
dc.subjectresidual stresses
dc.subjectthin films
dc.subjectX-ray diffraction
dc.titleResidual stress estimation of ceramic thin films by X-ray diffraction and indentation techniques
dc.typeArticle

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