Evaluation of Refractive Index Variations of TiO2:SiO2:Zr Thin Films by Molar Ratio

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dc.contributor.authorOral, Z. B. Bahsi
dc.date.accessioned2025-10-29T11:36:18Z
dc.date.issued2015
dc.departmentFakülteler, Mühendislik Fakültesi, Çevre Mühendisliği Bölümü
dc.description4th International Congress in Advances in Applied Physics and Materials Science (APMAS) -- APR 24-27, 2014 -- Fethiye, TURKEY
dc.description.abstractZr-doped and undoped TiO2-SiO2 thin films were fabricated by using sol-gel dip coating. TiO2:SiO2:Zr films with different molar ratio were coated on glass substrates. Refractive indexes and the thicknesses of thin films were measured with Metricon 2010 Prism Coupler. The theoretical and measured refractive indexes of thin films were found to be consistently changing with molar ratio. The measured refractive indexes of thin films were lower than the theoretical ones due to the porosity of the structure.
dc.identifier.endpage1316
dc.identifier.issn0587-4246
dc.identifier.issn1898-794X
dc.identifier.issue4
dc.identifier.orcid0000-0001-5513-0847
dc.identifier.scopus2-s2.0-84938835061
dc.identifier.scopusqualityQ3
dc.identifier.startpage1314
dc.identifier.urihttps://hdl.handle.net/20.500.14854/13179
dc.identifier.volume127
dc.identifier.wosWOS:000357937100127
dc.identifier.wosqualityQ4
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.institutionauthorOral, Z. B. Bahsi
dc.language.isoen
dc.publisherPolish Acad Sciences Inst Physics
dc.relation.ispartofActa Physica Polonica A
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20251020
dc.subjectSol-Gel Process
dc.subjectPhotocatalytic Properties
dc.subjectPrism Coupler
dc.subjectPrecursor
dc.titleEvaluation of Refractive Index Variations of TiO2:SiO2:Zr Thin Films by Molar Ratio
dc.typeConference Object

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