Plane wave diffraction by the junction of a thick impedance half-plane and a thick dielectric slab

Abstract

Plane wave diffraction at the junction of a thick impedance half-plane and a thick dielectric slab is investigated by using the Fourier transform technique. Relying upon the image bisection principle, the original problem is split into two simpler ones and each individual boundary-value problem is formulated as a modified Wiener-Hopf equation whose solution requires the determination of a set of infinitely many expansion coefficients which satisfy an infinite linear system of algebraic equations which can be solved easily by numerical tools. The effects of the material properties of the dielectric slab, the thickness of the junction and the characteristic impedances on different faces of the thick half-plane are presented graphically.