Dielectric relaxation in ferroelectric TlInS2 layered crystals within metastable chaotic state

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dc.contributor.authorSenturk, E.
dc.contributor.authorTumbek, L.
dc.contributor.authorMikailov, F. A.
dc.contributor.authorSaiehli, F.
dc.date.accessioned2025-10-29T11:34:18Z
dc.date.issued2007
dc.departmentFakülteler, Temel Bilimler Fakültesi, Fizik Bölümü
dc.description.abstractThe results of investigations low frequency dielectric relaxation in layered ferroelectric TlInS2 crystals are presented. The measurements were performed in the temperature range of 180-230 K and in the frequency range of 5 kHz-1 MHz. Two different relaxation processes were observed in mentioned temperature interval. The crystal has slow and fast relaxation mechanisms in low and high frequency region, respectively. The presence of two different relaxation mechanisms in TlInS, is discussed. (C) 2007 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
dc.identifier.doi10.1002/crat.200610875
dc.identifier.endpage630
dc.identifier.issn0232-1300
dc.identifier.issue6
dc.identifier.scopus2-s2.0-34547515099
dc.identifier.scopusqualityQ3
dc.identifier.startpage626
dc.identifier.urihttps://doi.org/10.1002/crat.200610875
dc.identifier.urihttps://hdl.handle.net/20.500.14854/12823
dc.identifier.volume42
dc.identifier.wosWOS:000247163700015
dc.identifier.wosqualityQ3
dc.indekslendigikaynakWeb of Science
dc.indekslendigikaynakScopus
dc.language.isoen
dc.publisherWiley-V C H Verlag Gmbh
dc.relation.ispartofCrystal Research and Technology
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_WOS_20251020
dc.subjectdielectric constant
dc.subjectlayered system
dc.subjectrelaxation
dc.subjectchaotic state
dc.titleDielectric relaxation in ferroelectric TlInS2 layered crystals within metastable chaotic state
dc.typeArticle

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