Effect of electric field on negative linear expansion of ferroelectric-semiconductor TlGaSe2
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info:eu-repo/semantics/closedAccess
Özet
The effect of electric field on the thermal expansion of the TlGaSe <inf>2</inf> ferroelectric-semiconductor with a layer crystalline structure has been investigated. A strong transformation of negative linear expansion coefficient in the layer plane has been observed as a result of the applied electric field. It was concluded that internal electric fields created by local polarized states in the ferroelectric- semiconductor are responsible for a negative thermal expansion and its behavior under the electric field. Predominantly, the electrostriction effect is the driving mechanism of the lattice deformation of TlGaSe<inf>2</inf> crystals at low temperatures. © 2009 American Institute of Physics. © 2009 Elsevier B.V., All rights reserved.
Açıklama
Anahtar Kelimeler
Applied electric field, Crystalline structure, Driving mechanism, Electrostriction effects, Internal electric fields, Lattice deformation, Layer planes, Linear expansion coefficient, Linear expansions, Low temperatures, Negative thermal expansion, Polarized state, Electric field measurement, Electric fields, Electrostriction, Ferroelectricity, Thermal stress, Thermal expansion
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Journal of Applied Physics
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Cilt
106
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6








