Step size determination approach for aging simulations in analog ICs

dc.contributor.authorAfacan, Engin
dc.date.accessioned2025-10-29T12:10:18Z
dc.date.issued2021
dc.departmentGebze Teknik Üniversitesi
dc.description2021 International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design, SMACD 2021 and 16th Conference on PhD Research in Microelectronics and Electronics, PRIME 2021 -- Virtual, Online -- 172054
dc.description.abstractSimulation of time-dependent variations is quite complicated since the degradation is a function of time, where the time step directly affects the accuracy and the efficiency of the analysis. Commercial tools use a constant step count during simulations, in which choosing a large step count may degrade the efficiency whereas keeping it small may result in accuracy problems. To overcome this problem, a couple of different adaptive time-step approaches have been proposed in the literature. Nevertheless, they suffer from the initial workload during step count determination or some other accuracy problems. In this study, we present a two-level step count determination approach. At the first level, the step count induced estimation error can be promptly determined via an effective simulation strategy. At the second level, the error is fitted into a saturated power law model; thus, the efficient step count can be determined without any simulation effort. The proposed approach provides a remarkable save in computation time and can be used for all analog circuits without loss of generality. © 2021 Elsevier B.V., All rights reserved.
dc.description.sponsorshipCadence; et al.; Europractice; Infineon; NXP; XFab
dc.identifier.endpage175
dc.identifier.isbn9783800755899
dc.identifier.scopus2-s2.0-85117370477
dc.identifier.scopusqualityN/A
dc.identifier.startpage172
dc.identifier.urihttps://hdl.handle.net/20.500.14854/15058
dc.indekslendigikaynakScopus
dc.institutionauthorAfacan, Engin
dc.language.isoen
dc.publisherVDE VERLAG GMBH
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanı
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.snmzKA_Scopus_20251020
dc.subjectAnalog integrated circuits
dc.subjectTiming circuits
dc.subjectAccuracy problems
dc.subjectAdaptive time step
dc.subjectAgeing simulation
dc.subjectCommercial tools
dc.subjectFunction of time
dc.subjectLevel steps
dc.subjectStep size determinations
dc.subjectTime dependent variations
dc.subjectTime step
dc.subjectTool use
dc.subjectEfficiency
dc.titleStep size determination approach for aging simulations in analog ICs
dc.typeConference Object

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