Precipitate splitting in Pb0.91La0.09Zr0.65Ti0.35O3 films

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Springer Heidelberg

Erişim Hakkı

info:eu-repo/semantics/closedAccess

Özet

The transformation to perovskite phase of Pb0.91La0.09Zr0.65Ti0.35O3 (9/65/35) films on r-sapphire and resulting annealed microstructures were examined by transmission electron microscopy. A random equiaxed polycrystalline grain morphology (approximately 600 nm) was observed after rapid-thermal annealing or furnace annealing when the as-deposited (radio-frequency-magnetron sputtering) films were predominantly pyrochlore. However, an interesting paired-plate structure was revealed after furnace annealing when the as-deposited films were fully perovskite. The average size of such a split precipitate was 35 nm in width and 150 nm in length.

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Anahtar Kelimeler

Electrical-Properties, Thin-Films, Microstructure, Sapphire

Kaynak

Journal of Materials Research

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Cilt

16

Sayı

10

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Onay

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